Certain Micro
Products
Equipment for P/C maintenance
Cmat understands the workflow of the Probe Card Room and the needs of its customers. With our own design capabilities, we design and manufacture simple, convenient fixtures and equipment that meet the needs of our customers
High-rigidity gantry microscope platform ｜For Probe Card Repair
Designed specifically for the maintenance of large probe cards, this system employs a gantry structure, providing a stable observation environment with high rigidity and low vibration. It supports precise XYZ movement and features a microscope tilt adjustment mechanism (approximately ±20°), allowing for flexible switching of observation angles and enhancing the ability to identify probe details.
Advantages
Large Table Design
Supports the largest probe cards such as V93K D/D, UltraFlex D/D, UltraFlex Plus, and V93K DUO DUT, meeting advanced packaging and testing requirements.
XYZ High-Load Moving Mechanism
The microscope can move smoothly in three axes, quickly positioning any observation area.
Microscope Tilt Adjustment (±10°)
Allows oblique viewing, effectively inspecting the probe's side morphology, contact angle, and wear condition, compensating for the blind spots of traditional vertical observation.
Gantry-Type High-Rigidity Structure
有Effectively reduces deflection and resonance, improving observation stability and repeatability.
Open Working Space Facilitates personnel operation and maintenance tool access, improving maintenance convenience.
CCC / MAC Analysis System
Advantages
Flexible Testing Logic Preset ISMI CCC standard procedures, while also supporting MAC (Maximum Allowable Current) mode or other custom modes to adapt to different customer specifications.
Precise Mechanical Capture Equipped with a 0.1 μm resolution load sensor, it monitors needle pressure decay under thermal stress in real time, accurately capturing 80%~60% of the physical failure threshold.
Micron-Level Displacement Control Integrates high-precision automatic Z-axis displacement (resolution ≤1µm), ensuring the reproducibility of overdrive settings and eliminating manual adjustment errors.
Automated Report OutputOne-click generation of "current-force-displacement" characteristic curves, which can be directly used for probe specification documentation.
Stable and Long-DurationDesigned for continuous current loads of 120 seconds or longer, ensuring that the measurement system does not drift under high current.
PProbe Card Sanding Machine
Appearance and Performance
• Dimensions: 750 x 750 x approx. 850 (mm)
• Weight: approx. 400 Kg
• Table Dimensions: 750 x 750 (mm)
• Grinding Surface: 160 x 160 (mm)
• Z-axis Travel: approx. 55 (mm)
• Minimum Feed: 1 (µm)
• Grinding Parallelism: ±5 (µm)Advantages
• Replaceable probe card base design.
• Maximum compatible probe card PCBs: 93K D/D, UltraFlex, UltraFlex Plus.
• Features manual and automatic programmable grinding functions.
• Z-axis handwheel operation for greater intuitiveness and convenience.
• Precise control of grinding height, minimum feed 1µm.
• Equipped with CCD imaging for real-time observation of probe tip condition.