Probe card is an essential probing interface in wafer testing, which involves several advanced technologies in the manufacturing processes. Before wafer slicing and IC packaging, the welding pads on the wafer chip must be probing for quality tests to prevent the defective parts be packaged. That the probe card affects the IC manufacture greatly is a critical technique and interface. CMAT have focused in the probe card components fabrication many years, and promote the machining precision continuously to obtain the best performance for the probe card made. The customer can give full play on the inspections when uses the card.